MEMS tech speeds automotive Ethernet fault tests
Fitted with MEMS switches, two fault insertion units (FIUs) from Pickering simulate common faults in MultiGBASE-T1 communication links. The single-slot 40-205 (PXI) and 42-205 (PXIe) modules target automotive hardware-in-the-loop simulation, enabling design verification of networking components such as ADAS controllers at data rates up to 10 Gbps.
Both PXI and PXIe modules provide 4 or 8 channels of impedance-matched, two-wire signal paths that support communication protocols from legacy 10BASE-T1 to the 10GBASE-T1 automotive Ethernet standard. The FIUs help verify safe and consistent controller operation under a range of connectivity faults, including open and short circuits.
Leveraging MEMS technology, the signal channels deliver low insertion loss and VSWR, along with stable RF performance beyond 6 GHz. Fast 50-µs switching boosts test throughput, while the 3-billion-cycle lifetime ensures durability. Each channel handles up to 0.5 A and 100 V between wire pairs, and the 1.6-A fault buses allow multiple channels to share the same fault condition.
The 8-channel 40-205 (PXI) and 42-205 (PXIe) FIU modules are priced at $10,995 each.
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