• Become a member
  • Log In
The Institution of Electronics
  • Home
  • About us
    • Our Objectives
    • Our History
    • Governance of the Institution
  • The Electron Magazine
    • 2024
      • 2024 – Winter
      • 2024 – Spring
      • 2024 – Summer
      • 2024 – Autumn
    • 2025
      • 2025 – Winter
      • 2025 – Spring
      • 2025 – Summer
      • 2025 – Autumn
    • 2026
      • 2026 – Winter
      • 2026 – Summer
  • Members
    • Membership Grades and Fees
    • Members’ Resources
      • The Electron Newsletter
      • The Archives
  • Education and Projects
    • National Electronics Competition
    • Student Members’ Projects
    • Arkwright Engineering Scholarships
  • News
  • Contact Us
  • Menu Menu
Uncategorised

1-GHz TDS upgrade triples EMI test speed

The Keysight N9048B PXE EMI test receiver, paired with a standalone stream processing unit (SPU), delivers real-time, gapless 1-GHz time domain scan (TDS) bandwidth. With the SPU upgrade, the receiver covers 30 MHz to 1 GHz in a single step—down from three in the previous version—tripling EMI test speed. Together, the units enable faster, more accurate EMI testing.

With 1-GHz FFT bandwidth, the system accelerates EMI scans by covering the CISPR C and D bands in a single pass and supports user-selectable resolution bandwidths of 9 kHz, 120 kHz, and 1 MHz. Real-time, gapless capture ensures no transient events are missed, while high sensitivity and wide dynamic range reveal signals close to the noise floor.

The test setup shortens troubleshooting time from hours to minutes and fully complies with CISPR 16-1-1:2019 requirements. Additionally, the standalone SPU provides a path for future upgrades, offering long-term flexibility.

The Keysight N9048B PXE EMI receiver will be showcased at Techno-Frontier 2025 in Tokyo at the TOYO booth. Learn more about the N9048BSPU stream processing unit by viewing the flyer here.

N9048B PXE product page

Keysight Technologies 

The post 1-GHz TDS upgrade triples EMI test speed appeared first on EDN.

25 July 2025
http://institutionofelectronics.ac.uk/wp-content/uploads/2022/12/IOE_LOGO.png 0 0 whdsolutions http://institutionofelectronics.ac.uk/wp-content/uploads/2022/12/IOE_LOGO.png whdsolutions2025-07-25 16:03:312025-07-25 16:03:311-GHz TDS upgrade triples EMI test speed

Latest news

  • AMD defines rack-scale infrastructure for agentic AI21 October 2026 - 19:45
  • Processor IP brings generative AI to edge devices21 October 2026 - 19:45
  • Rad-tolerant GaN converter powers space electronics21 October 2026 - 19:45
  • MCUs accelerate multimodal edge AI21 October 2026 - 19:45
  • Altera extends Agilex FPGAs to defense systems21 October 2026 - 19:45
  • Clustered-bit PWM DAC pedals and settles in a “unicycle”21 October 2026 - 13:41
  • Automotive sensor power supply without a switching pre-regulator20 October 2026 - 13:21
  • SFP: The multimode module autopsy19 October 2026 - 13:59
  • Fiber optic gyroscopes: Elegant engineering of modern inertial navigation19 October 2026 - 04:52
  • Automotive demands driving passive components to extreme performance16 October 2026 - 18:58
IOE LOGO 2

Become a member

click here

Become a member

click here

Become a subscriber

click here

Become a sponsor

click here

© Copyright - The Institution of Electronics | Website by WHD Solutions
  • Link to LinkedIn
  • Link to Facebook
  • Link to X
Link to: Flip ON Flop OFF for 48-VDC systems Link to: Flip ON Flop OFF for 48-VDC systems Flip ON Flop OFF for 48-VDC systems Link to: Zigbee/BLE module enables scalable IoT networking Link to: Zigbee/BLE module enables scalable IoT networking Zigbee/BLE module enables scalable IoT networking
Scroll to top Scroll to top Scroll to top