• Become a member
  • Log In
The Institution of Electronics
  • Home
  • About us
    • Our Objectives
    • Our History
    • Governance of the Institution
  • The Electron Magazine
    • 2024
      • 2024 – Winter
      • 2024 – Spring
      • 2024 – Summer
      • 2024 – Autumn
    • 2025
      • 2025 – Winter
      • 2025 – Spring
      • 2025 – Summer
      • 2025 – Autumn
    • 2026
      • 2026 – Winter
  • Members
    • Membership Grades and Fees
    • Members’ Resources
      • The Electron Newsletter
      • The Archives
  • Education and Projects
    • National Electronics Competition
    • Student Members’ Projects
    • Arkwright Engineering Scholarships
  • News
  • Contact Us
  • Menu Menu
Uncategorised

Entry-level MCUs ease system control

Toshiba is sampling its TXZ+ Entry-Class M4H microcontroller group for small-scale system control of consumer and industrial equipment. Powered by a 120-MHz Arm Cortex-M4 core with an FPU, the devices deliver the real-time performance needed for applications ranging from home appliances to factory automation.

M4H MCUs operate from a 2.7-V to 5.5-V supply, supporting 5-V powered equipment. A built-in high-speed oscillator provides ±1% accuracy across a –40°C to +105°C temperature range, eliminating the need for an external oscillator. Integrated peripherals include a 12-bit ADC, timers, UART, SPI, I²C, and DMA. The devices also feature an advanced programmable motor driver for brushless DC motor control.

Engineering samples are available for evaluation, along with starter kits, sample software, CMSIS-compliant drivers, and support for major IDEs.

TXZ+ Entry-Class M4H product page 

Toshiba Electronic Devices & Storage

The post Entry-level MCUs ease system control appeared first on EDN.

27 May 2026
http://institutionofelectronics.ac.uk/wp-content/uploads/2022/12/IOE_LOGO.png 0 0 whdsolutions http://institutionofelectronics.ac.uk/wp-content/uploads/2022/12/IOE_LOGO.png whdsolutions2026-05-27 18:43:572026-05-27 18:43:57Entry-level MCUs ease system control

Latest news

  • Radon: Level detection, risk determination, and as-needed mitigation13 August 2026 - 13:16
  • TI a first mover in CAN XL transceivers13 August 2026 - 10:13
  • Four-channel USB-UART IC boosts server management13 August 2026 - 05:08
  • eFuse speeds overcurrent detection13 August 2026 - 05:08
  • Memory platform tackles AI bottlenecks13 August 2026 - 05:08
  • 6.5-kV SiC MOSFET reaches 8-kV blocking13 August 2026 - 05:08
  • Made by Google 2026: This limited silicon-supply situation really sucks13 August 2026 - 05:08
  • Cheap and cheerful LMC555 RC PWM pulse generator12 August 2026 - 13:56
  • Record high wafer shipments. Can fabs keep pace?12 August 2026 - 07:51
  • Analog uncertainty-aware design: How it replaces Monte Carlo with certifiable yield intelligence11 August 2026 - 16:31
IOE LOGO 2

Become a member

click here

Become a member

click here

Become a subscriber

click here

Become a sponsor

click here

© Copyright - The Institution of Electronics | Website by WHD Solutions
  • Link to LinkedIn
  • Link to Facebook
  • Link to X
Link to: A closer look at Huawei’s chip design workaround without EUV Link to: A closer look at Huawei’s chip design workaround without EUV A closer look at Huawei’s chip design workaround without EUV Link to: SiC modules simplify high-voltage topologies Link to: SiC modules simplify high-voltage topologies SiC modules simplify high-voltage topologies
Scroll to top Scroll to top Scroll to top